CJASN -- Index by Author (Mar 2006; Volume 1, Number 2)

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Index by Author: Mar 2006; 1 (2) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Abbott, Kevin C. [Abstract] [Full Text]; Achkar, Katafan [Abstract] [Full Text]; Agarwal, Rajiv [Abstract] [Full Text]; Alvestrand, Anders [Abstract] [Full Text]; Asif, Arif [Abstract] [Full Text]
B: Baird, Bradley C. [Abstract] [Full Text]; Bakris, George [Full Text]; Barany, Peter [Abstract] [Full Text]; Beathard, Gerald A. [Abstract] [Full Text]; Becker, Gavin J. [Abstract] [Full Text]; Bertenthal, Daniel [Abstract] [Full Text]; Block, Geoffrey [Full Text]; Blumenthal, Samuel [Abstract] [Full Text]; Bommer, Jürgen [Abstract] [Full Text]; Brennan, Daniel C. [Abstract] [Full Text]; Breyer, Matthew D. [Abstract] [Full Text]; Bucci, Charles M. [Abstract] [Full Text]; Burroughs, Thomas E. [Abstract] [Full Text]
C: Canaud, Bernard J. [Abstract] [Full Text]; Chelamcharla, Madhukar [Abstract] [Full Text]; Chertow, Glenn M. [Abstract] [Full Text]; Chertow, Glenn M. [Abstract] [Full Text]; Chi, Eric M. [Abstract] [Full Text]; Chonchol, Michel [Full Text]; Chren, Mary-Margaret [Abstract] [Full Text]; Chrysostomou, Anastasia [Abstract] [Full Text]; Connelly, Kim [Abstract] [Full Text]
D: Dequidt, Clement [Abstract] [Full Text]; Dunn, Stephen R. [Abstract] [Full Text]
E: Eknoyan, Garabed [Abstract] [Full Text]
F: Falkner, Bonita [Abstract] [Full Text]; Fellström, Bengt [Abstract] [Full Text]; Finley, Miles P. [Abstract] [Full Text]; Friedman, Allon [Abstract] [Full Text]
G: Gavard, Jeffrey A. [Abstract] [Full Text]; Gilbert, David N. [Abstract] [Full Text]; Gilbert, Richard E. [Abstract] [Full Text]; Goldfarb-Rumyantzev, Alexander S. [Abstract] [Full Text]
H: Habib, Arsalan N. [Abstract] [Full Text]; Harris, Raymond C. [Abstract] [Full Text]; Hebert, Lee A. [Full Text]; Heimburger, Olof [Abstract] [Full Text]; Howard, Richard J. [Abstract] [Full Text]
I: Isaacs, Ross B. [Abstract] [Full Text]
J: Jadoul, Michel [Abstract] [Full Text]
K: Kaplan, Bruce [Abstract] [Full Text]; Kelly, Darren J. [Abstract] [Full Text]; Khanna, Ramesh [Full Text]; Khosla, Nitin [Full Text]; Koford, James K. [Abstract] [Full Text]; Krenz, Ingo [Full Text]; Krum, Henry [Abstract] [Full Text]; Kurokawa, Kiyoshi [Abstract] [Full Text]
L: Lameire, Norbert [Abstract] [Full Text]; Lentine, Krista L. [Abstract] [Full Text]; Li, Leiming [Abstract] [Full Text]; Lin, Shih-jui [Abstract] [Full Text]; Linas, Stuart [Full Text]; Lindholm, Bengt [Abstract] [Full Text]; Locatelli, Francesco [Abstract] [Full Text]; Luft, Friedrich C. [Abstract] [Full Text]
M: MacGregor, Lachlan [Abstract] [Full Text]; Massy, Ziad A. [Abstract] [Full Text]; McGowan, Tracy A. [Abstract] [Full Text]; Mehta, Ravindra L. [Abstract] [Full Text]; Meier-Kriesche, Herwig-Ulf [Abstract] [Full Text]; Moe, Sharon [Abstract] [Full Text]; Müller, Dominik N. [Abstract] [Full Text]
N: Nassar, George M. [Abstract] [Full Text]; Nguyen, Binh [Abstract] [Full Text]
O: O’Hare, Ann M. [Abstract] [Full Text]; on behalf of the CONTROL Investigators, [Abstract] [Full Text]
P: Pedagogos, Eugenia [Abstract] [Full Text]; Pisoni, Ronald L. [Abstract] [Full Text]; Pollock, Carol A. [Abstract] [Full Text]; Port, Friedrich K. [Abstract] [Full Text]
Q: Qureshi, Abdul Rashid [Abstract] [Full Text]
R: Reed, John [Abstract] [Full Text]; Rhee, Edward [Abstract] [Full Text]; Rodríguez-Ayala, Ernesto [Abstract] [Full Text]; Roppolo, Michael [Abstract] [Full Text]; Roy-Chaudhury, Prabir [Abstract] [Full Text]
S: Schnitzler, Mark A. [Abstract] [Full Text]; Schold, Jesse D. [Abstract] [Full Text]; Sen, Saunak [Abstract] [Full Text]; Sharma, Kumar [Abstract] [Full Text]; Shihab, Fuad [Abstract] [Full Text]; Shlipak, Michael G. [Abstract] [Full Text]; Sidawy, Anton N. [Abstract] [Full Text]; Srinivas, Titte R. [Abstract] [Full Text]; Stahl, Rolf A.K. [Full Text]; Stenvinkel, Peter [Abstract] [Full Text]; Stern, Leonard [Abstract] [Full Text]
T: Takemoto, Steven K. [Abstract] [Full Text]; Turner, Stewart [Abstract] [Full Text]
V: Van Biesen, Wim [Abstract] [Full Text]; Van Der Tol, Arjan [Abstract] [Full Text]; Vanholder, Raymond [Abstract] [Full Text]; Veys, Nic [Abstract] [Full Text]; Vijt, Denise [Abstract] [Full Text]
W: Wang, Ben-Jr [Abstract] [Full Text]; Wenzel, Ulrich O. [Full Text]; Williams, Mark E. [Full Text]; Willoughby, Lisa M. [Abstract] [Full Text]; Womer, Karl L. [Abstract] [Full Text]
X: Xiao, Huiling [Abstract] [Full Text]
Y: Young, Eric W. [Abstract] [Full Text]